{"product_id":"9780470511916","title":"ESD Testing From Components to Systems","description":"\u003ch1\u003eESD Testing\u003c\/h1\u003e\u003ch2\u003eFrom Components to Systems\u003c\/h2\u003e\u003ch3\u003eSteven H. Voldman\u003c\/h3\u003e\u003cdiv\u003e\u003cb\u003eTechnology \u0026amp; Engineering \/ Electronics \/ Circuits \/ General\u003c\/b\u003e\u003c\/div\u003e\u003cbr\u003e\u003cdiv\u003e\n\u003cp\u003eWith the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance.\u003c\/p\u003e \u003cp\u003e\u003ci\u003eESD Testing: From Components to Systems\u003c\/i\u003e updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. \u003c\/p\u003e \u003cp\u003eKey features:\u003c\/p\u003e \u003cul\u003e \u003cli\u003eProvides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5.\u003c\/li\u003e \u003cli\u003eDiscusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP).\u003c\/li\u003e \u003cli\u003eDescribes both conventional testing and new testing techniques for both chip and system level evaluation.\u003c\/li\u003e \u003cli\u003eAddresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods.\u003c\/li\u003e \u003cli\u003eDiscusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. \u003c\/li\u003e \u003c\/ul\u003e \u003cp\u003e\u003ci\u003eESD Testing: From Components to Systems\u003c\/i\u003e is part of the authors’ series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference.  In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work.\u003c\/p\u003e\n\u003c\/div\u003e\u003cdiv\u003e \u003cp\u003e\u003cb\u003eDr Steven H. Voldman, IEEE Fellow, Vermont, USA\u003c\/b\u003e\u003cbr\u003eDr. Steven H. Voldman is the first IEEE Fellow in the field of electrostatic discharge (ESD) for \"Contributions in ESD protection in CMOS, Silicon On Insulator and Silicon Germanium Technology.\" Voldman was a member of the semiconductor development of IBM for 25 years as well as a consultant for TSMC, and Samsung Electronics. Dr. Voldman initiated the first transmission line pulse (TLP) standard development team, and a participant in the JEDEC-ESD Association standards harmonization of the human body model (HBM) Standard. From 2000 to 2013, as Chairman of the ESD Association Work Group on TLP and very-fast TLP (VF-TLP), his team was responsible for initiating the first standard practice and standards for TLP and VF-TLP. He initiated the \"ESD on Campus\" program which was established to bring ESD lectures and interaction to university faculty and students internationally; the ESD on Campus program has reached over 40 universities in the United States, Korea, Singapore, Taiwan, Malaysia, Philippines, Thailand, India, and China. Dr. Voldman teaches short courses and tutorials on ESD, latchup, patenting, and invention.\u003c\/p\u003e\n\u003c\/div\u003e\u003cbr\u003e\u003ctable\u003e\n\u003ctr\u003e\n\u003ctd\u003ePublication Date: \u003c\/td\u003e\n\u003ctd\u003e27 December 2016\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003ePublisher: \u003c\/td\u003e\n\u003ctd\u003eWiley\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eImprint: \u003c\/td\u003e\n\u003ctd\u003eWiley\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eISBN-13: \u003c\/td\u003e\n\u003ctd\u003e9780470511916\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eFormat: \u003c\/td\u003e\n\u003ctd\u003eHardback\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003ePage Count: \u003c\/td\u003e\n\u003ctd\u003e336\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003ctr\u003e\n\u003ctd\u003eWeight (oz): \u003c\/td\u003e\n\u003ctd\u003e22.4\u003c\/td\u003e\n\u003c\/tr\u003e\n\u003c\/table\u003e","brand":"Wiley","offers":[{"title":"Default Title","offer_id":44348221161612,"sku":"9780470511916","price":117.85,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9780470511916_ef8207d4-964f-4ee3-b577-d2f2897aff53.jpg?v=1780145930","url":"https:\/\/lateknightbooks.com\/products\/9780470511916","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}