{"product_id":"9780792390589","title":"Hierarchical Modeling for VLSI Circuit Testing","description":"\u003ch1\u003eHierarchical Modeling for VLSI Circuit Testing\u003c\/h1\u003e \u003ch2\u003eBhattacharya, Debashis; Hayes, John P.\u003c\/h2\u003e \u003cp\u003eTest generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated circuit technology. It is long been recognized that the testing prob­ lem can be alleviated by the use of higher-level methods in which multigate modules or cells are the primitive components in test generation; however, the development of such methods has proceeded very slowly. To be acceptable, high-level approaches should be applicable to most types of digital circuits, and should provide fault coverage comparable to that of traditional, low-level methods. The fault coverage problem has, perhaps, been the most intractable, due to continued reliance in the testing industry on the single stuck-line (SSL) fault model, which is tightly bound to the gate level of abstraction. This monograph presents a novel approach to solving the foregoing problem. It is based on the systematic use of multibit vectors rather than single bits to represent logic signals, including fault signals. A circuit is viewed as a collection of high-level components such as adders, multiplexers, and registers, interconnected by n-bit buses. To match this high-level circuit model, we introduce a high-level bus fault that, in effect, replaces a large number of SSL faults and allows them to be tested in parallel. However, by reducing the bus size from n to one, we can obtain the traditional gate-level circuit and models.\u003c\/p\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 1989-12-31\u003c\/p\u003e \u003cp\u003eFormat: Hardcover\u003c\/p\u003e \u003cp\u003eISBN-13: 9780792390589\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/978-1-4613-1527-8\u003c\/p\u003e \u003cp\u003eDimensions: 235.0cm x155.0cm\u003c\/p\u003e \u003cp\u003ePages: 160.0\u003c\/p\u003e ","brand":"Springer US","offers":[{"title":"Default Title","offer_id":45578421076108,"sku":"9780792390589","price":98.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9780792390589.jpg?v=1767146746","url":"https:\/\/lateknightbooks.com\/products\/9780792390589","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}