{"product_id":"9780792392224","title":"The Springer International Series in Engineering and Computer Science","description":"\u003ch1\u003eThe Springer International Series in Engineering and Computer Science\u003c\/h1\u003e \u003ch2\u003eButler, Kenneth M.; Mercer, M. Ray\u003c\/h2\u003e \u003cp\u003eFor many years, the dominant fault model in automatic test pattern gen­ eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and\/or high computational expense. In this monograph we introduce a methodology to address the ques­ tion in a manner which circumvents the drawbacks of previous approaches. The method is based on symbolic Boolean functional analyses using Or­ dered Binary Decision Diagrams (OBDDs). OBDDs have been conjectured to be an attractive representation form for Boolean functions, although cases ex­ ist for which their complexity is guaranteed to grow exponentially with input cardinality. Classes of Boolean functions which exploit the efficiencies inherent in OBDDs to a very great extent are examined in Chapter 7. Exact equa­ tions giving their OBDD sizes are derived, whereas until very recently only size bounds have been available. These size equations suggest that straight­ forward applications of OBDDs to design and test related problems may not prove as fruitful as was once thought.\u003c\/p\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 1991-10-31\u003c\/p\u003e \u003cp\u003eFormat: Hardcover\u003c\/p\u003e \u003cp\u003eISBN-13: 9780792392224\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/978-1-4615-3606-2\u003c\/p\u003e \u003cp\u003eDimensions: 235cm x155cm\u003c\/p\u003e \u003cp\u003ePages: 132\u003c\/p\u003e ","brand":"Springer US","offers":[{"title":"Default Title","offer_id":45578398695564,"sku":"9780792392224","price":98.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9780792392224.jpg?v=1775009545","url":"https:\/\/lateknightbooks.com\/products\/9780792392224","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}