{"product_id":"9780792393047","title":"Estimating Device Reliability:: Assessment of Credibility","description":"\u003ch1\u003eEstimating Device Reliability:: Assessment of Credibility\u003c\/h1\u003e \u003ch2\u003eNash, Franklin R.\u003c\/h2\u003e \u003cp\u003e\u003cem\u003eEstimating Device Reliability: Assessment of Credibility\u003c\/em\u003e  is concerned with the plausibility of reliability estimates obtained  from statistical models. Statistical predictions are necessary because  technology is always pushing into unexplored areas faster than devices  can be made long-lived by design. Flawed reliability methodologies can  produce disastrous results, an outstanding example of which is the  catastrophic failure of the manned space shuttle CHALLENGER in January  1986. This issue is not whether, but which, statistical models should  be used. The issue is not making reliability estimates, but is instead  their credibility. The credibility questions explored in the context  of practical applications include:\u003c\/p\u003e\u003cul\u003e \u003cli\u003e What does the  confidence level associated with the use of statistical model mean?  \u003c\/li\u003e  \u003cli\u003e Is the numerical result associated with a high confidence level  beyond dispute? \u003c\/li\u003e  \u003cli\u003e When is it appropriate to use the exponential  (constant hazard rate) model? Does this model always provide the most  conservative reliability estimate? \u003c\/li\u003e  \u003cli\u003e Are the results of  traditional `random' failure hazard rate calculations tenable? Are  there persuasive alternatives? \u003c\/li\u003e  \u003cli\u003e What model should be used to  describe the useful life of a device when wearout is absent? \u003c\/li\u003e  \u003cli\u003e  When Weibull and lognormal failure plots containing a large number of  failure times appear similar, how should the correct wearout model be  selected?  \u003c\/li\u003e  \u003cli\u003e Is it important to distinguish between a  conservative upper bound on a probability of failure and a realistic  estimate of the same probability? \u003c\/li\u003e  \u003c\/ul\u003e   \u003cem\u003eEstimating Device  Reliability: Assessment of Credibility\u003c\/em\u003e is for those who are obliged  to make reliability calculations with a paucity of somewhat corrupt  data, by using inexact models, and by making physical assumptions  which are impractical to verify. Illustrative examples deal with a  variety of electronic devices, ICsand lasers. \u003cbr\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 1992-11-30\u003c\/p\u003e \u003cp\u003eFormat: Hardcover\u003c\/p\u003e \u003cp\u003eISBN-13: 9780792393047\u003c\/p\u003e \u003cp\u003eDOI: \u003c\/p\u003e \u003cp\u003eDimensions: 234.0cm x156.0cm\u003c\/p\u003e \u003cp\u003ePages: 214.0\u003c\/p\u003e ","brand":"Springer US","offers":[{"title":"Default Title","offer_id":45578389160076,"sku":"9780792393047","price":152.99,"currency_code":"USD","in_stock":true}],"url":"https:\/\/lateknightbooks.com\/products\/9780792393047","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}