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Scan Statistics

Scan Statistics Methods and Applications

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Statistics for Industry and Technology

Scan Statistics

Methods and Applications

Joseph Glaz | Vladimir Pozdnyakov | Sylvan Wallenstein

Mathematics / Probability & Statistics / General

Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.


Publication Date: 28 May 2009
Publisher: Birkhäuser Boston
Imprint: Birkhäuser
ISBN-13: 9780817647483
Format: Hardback
Page Count: 394

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