Integrate ISO 26262 functional safety across your automotive development lifecycle

As vehicles grow more complex with autonomous systems, EVs, and connected technologies, functional safety requirements intensify throughout development. Automotive Functional Safety: A Practical Guide to ISO 26262 delivers a straightforward, jargon-free approach to implementing safety concepts across the product lifecycle. Written by two semiconductor industry professionals, this guide connects safety principles directly to real-world automotive engineering practice.

The book aligns with ISO 26262 structure, covering safety organization and culture, system engineering and architecture, hazard analysis and risk assessment, and safety analysis methods including fault tree analysis, failure modes and effects analysis, and dependent failure analysis. Case studies demonstrate application across the automotive supply chain, from automakers and OEMs to Tier 1 and Tier 2 suppliers.

Readers will also find:

• Fundamental functional safety concepts and best practices including safety management principles, safety culture development, and safety audits and assessments
• Practical guidance on integrating the overall functional safety process within typical automotive product development lifecycle workflows and milestones
• Comprehensive coverage of how functional safety applies across the entire automotive value chain from automakers to component suppliers
• Real-world examples and case studies illustrating how to apply key ISO 26262 principles in actual engineering and development scenarios
• Clear explanations of how innovation in mobility technologies can proceed alongside rigorous safety requirements for automotive electronic systems

Automotive Functional Safety is for automotive engineers, safety managers, and business leads involved in developing safety-critical systems. Students and researchers in safety engineering and semiconductor reliability will find this resource equally valuable for understanding how ISO 26262 principles apply throughout the automotive industry.

Gulroz Singh is a Senior SoC Functional Safety Architect at NXP Semiconductors specializing in automotive functional safety, safety analysis methods, electronics reliability, and model-based systems engineering. He is a frequent speaker at the Embedded World Conference and Applied Intelligence Live Conference, and has lectured at the University of Alabama and Portland State University.

Harshini Yerra is a Functional Safety Lead at Microchip Technologies with over fifteen years of experience in the semiconductor industry. She previously held roles at Intel Corporation in system test architecture, benchmarking and workload analysis, validation, and manufacturing, bringing deep practical expertise to safety-critical system development.