Strain Effect in Semiconductors: Theory and Device Applications

Sun, Yongke; Thompson, Scott E.; Nishida, Toshikazu

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.

Details

Published by: Springer

Publication Date: 2009-12-04

Format: Hardcover

ISBN-13: 9781441905512

DOI: 10.1007/978-1-4419-0552-9

Dimensions: 235cm x155cm

Pages: 350