{"product_id":"9781461349693","title":"Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition","description":"\u003ch1\u003eScanning Electron Microscopy and X-Ray Microanalysis: Third Edition\u003c\/h1\u003e \u003ch2\u003eGoldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.\u003c\/h2\u003e \u003cp\u003eIn the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure\/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and “through-the-lens” detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.\u003c\/p\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 2013-05-31\u003c\/p\u003e \u003cp\u003eFormat: Paperback\u003c\/p\u003e \u003cp\u003eISBN-13: 9781461349693\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/978-1-4615-0215-9\u003c\/p\u003e \u003cp\u003eDimensions: 254cm x178cm\u003c\/p\u003e \u003cp\u003ePages: 689\u003c\/p\u003e ","brand":"Springer US","offers":[{"title":"Default Title","offer_id":44341385592972,"sku":"9781461349693","price":107.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9781461349693.jpg?v=1776523101","url":"https:\/\/lateknightbooks.com\/products\/9781461349693","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}