Circuit Design for Reliability

Reis, Ricardo; Cao, Yu; Wirth, Gilson

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

Details

Published by: Springer

Publication Date: 2014-11-08

Format: Hardcover

ISBN-13: 9781461440772

DOI: 10.1007/978-1-4614-4078-9

Dimensions: 235cm x155cm

Pages: 272