{"product_id":"9781475771282","title":"The Boundary-Scan Handbook: Analog and Digital","description":"\u003ch1\u003eThe Boundary-Scan Handbook: Analog and Digital\u003c\/h1\u003e \u003ch2\u003eParker, Kenneth P.\u003c\/h2\u003e \u003cp\u003eBoundary-Scan, formally known as IEEE\/ANSI Standard  1149.1-1990, is a collection of design rules applied principally at  the Integrated Circuit (IC) level that allow software to alleviate the  growing cost of designing, producing and testing digital systems. A  fundamental benefit of the standard is its ability to transform  extremely difficult printed circuit board testing problems that could  only be attacked with ad-hoc testing methods into well-structured  problems that software can easily deal with. \u003cbr\u003e  IEEE standards, when embraced by practicing engineers, are living  entities that grow and change quickly. \u003cem\u003eThe Boundary-Scan  Handbook,\u003c\/em\u003e \u003cem\u003eSecond Edition: Analog and Digital\u003c\/em\u003e is intended to  describe these standards in simple English rather than the strict and  pedantic legalese encountered in the standards. \u003cbr\u003e  The 1149.1 standard is now over eight years old and has a large  infrastructure of support in the electronics industry. Today, the  majority of custom ICs and programmable devices contain 1149.1. New  applications for the 1149.1 protocol have been introduced, most  notably the `In-System Configuration' (ISC) capability for Field  Programmable Gate Arrays (FPGAs). \u003cbr\u003e  \u003cem\u003eThe Boundary-Scan Handbook, Second Edition: Analog and Digital\u003c\/em\u003e  updates the information about IEEE Std. 1149.1, including the 1993  supplement that added new silicon functionality and the 1994  supplement that formalized the BSDL language definition. In addition,  the new second edition presents completely new information about the  newly approved 1149.4 standard often termed `Analog Boundary-Scan'.  Along with this is a discussion of Analog Metrology needed to make use  of 1149.1. This forms a toolset essential for testing boards and  systems of the future.\u003c\/p\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 2013-08-09\u003c\/p\u003e \u003cp\u003eFormat: Paperback\u003c\/p\u003e \u003cp\u003eISBN-13: 9781475771282\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/b117549\u003c\/p\u003e \u003cp\u003eDimensions: 235cm x155cm\u003c\/p\u003e \u003cp\u003ePages: 288\u003c\/p\u003e ","brand":"Springer US","offers":[{"title":"Default Title","offer_id":46312903934092,"sku":"9781475771282","price":98.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9781475771282.jpg?v=1771532602","url":"https:\/\/lateknightbooks.com\/products\/9781475771282","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}