Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures

Stanisavljević, Miloš; Schmid, Alexandre; Leblebici, Yusuf

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

Details

Published by: Springer

Publication Date: 2014-10-11

Format: Paperback

ISBN-13: 9781489982544

DOI: 10.1007/978-1-4419-6217-1

Dimensions: 235cm x155cm

Pages: 195