{"product_id":"9781489983152","title":"Strain Effect in Semiconductors: Theory and Device Applications","description":"\u003ch1\u003eStrain Effect in Semiconductors: Theory and Device Applications\u003c\/h1\u003e \u003ch2\u003eSun, Yongke; Thompson, Scott E.; Nishida, Toshikazu\u003c\/h2\u003e \u003cp\u003eStrain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.\u003c\/p\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 2014-11-20\u003c\/p\u003e \u003cp\u003eFormat: Paperback\u003c\/p\u003e \u003cp\u003eISBN-13: 9781489983152\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/978-1-4419-0552-9\u003c\/p\u003e \u003cp\u003eDimensions: 235cm x155cm\u003c\/p\u003e \u003cp\u003ePages: 350\u003c\/p\u003e ","brand":"Springer US","offers":[{"title":"Default Title","offer_id":49940295876748,"sku":"9781489983152","price":152.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9781489983152.jpg?v=1779057264","url":"https:\/\/lateknightbooks.com\/products\/9781489983152","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}