{"product_id":"9781489989529","title":"Test and Diagnosis for Small-Delay Defects","description":"\u003ch1\u003eTest and Diagnosis for Small-Delay Defects\u003c\/h1\u003e \u003ch2\u003eTehranipoor, Mohammad; Peng, Ke; Chakrabarty, Krishnendu\u003c\/h2\u003e \u003cp\u003eThis book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.\u003c\/p\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 2014-11-28\u003c\/p\u003e \u003cp\u003eFormat: Paperback\u003c\/p\u003e \u003cp\u003eISBN-13: 9781489989529\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/978-1-4419-8297-1\u003c\/p\u003e \u003cp\u003eDimensions: 235cm x155cm\u003c\/p\u003e \u003cp\u003ePages: 212\u003c\/p\u003e ","brand":"Springer New York","offers":[{"title":"Default Title","offer_id":47674988003468,"sku":"9781489989529","price":116.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9781489989529.jpg?v=1776539378","url":"https:\/\/lateknightbooks.com\/products\/9781489989529","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}