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This book proposes tools for analysis of multidimensional and metric data, by establishing a state-of-the-art of the existing solutions and developing new ones. It mainly focuses on visual exploration of these data by a human analyst, relying on a 2D or 3D scatter plot display obtained through Dimensionality Reduction.
In particular, it presents the new unsupervised technique ASKI and the supervised methods ClassNeRV and ClassJSE. Moreover, MING, a new approach for local map quality evaluation is also introduced. These methods are then applied to the representation of expert-designed fault indicators for smart-buildings, I-V curves for photovoltaic systems and acoustic signals for Li-ion batteries.
Published by: Springer
Publication Date: 2022-12-04
Format: Paperback
ISBN-13: 9783030810283
DOI: 10.1007/978-3-030-81026-9
Dimensions: 235cm x155cm
Pages: 247