VLSI Design and Test 26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers
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The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
VLSI Design and Test 26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers
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$98.99
Regular price $109.99
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Communications in Computer and Information Science
VLSI Design and Test
26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers
Ambika Prasad Shah | Sudeb Dasgupta | Anand Darji | Jaynarayan Tudu
Computers / Hardware / General
This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.
| Publication Date: | 17 December 2022 |
| Publisher: | Springer Nature Switzerland |
| Imprint: | Springer |
| ISBN-13: | 9783031215131 |
| Format: | Paperback softback |
| Page Count: | 596 |