Join our mailing list
Get exclusive deals and learn about new products!
Reliable shipping
Flexible returns
This book presents recent advances in reliability investigation of MOS transistors and their applications. Theory and experimental results are discussed, in order to demonstrate the efficacy of the techniques presented. Readers will be enabled to improve their designs in application areas of analog signal processing, ranging from very low frequencies at several Hz levels of biomedical signals to RF applications operating at GHz level, from EEG signals to cognitive radio and encrypted communications or low-noise amplifiers in wireless communications.
Published by: Springer
Publication Date: 2025-06-13
Format: Hardcover
ISBN-13: 9783031854545
DOI: 10.1007/978-3-031-85455-2
Dimensions: 235cm x155cm
Pages: 94