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This book describes the basic technologies and operation principles of charge-trapping non-volatile memories. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved as well as the fundamental properties of the technology. Modern material properties used as charge-trapping layers, for new applications are introduced.
Published by: Springer
Publication Date: 2015-08-14
Format: Hardcover
ISBN-13: 9783319152899
DOI: 10.1007/978-3-319-15290-5
Dimensions: 235cm x155cm
Pages: 211