Skip to product information
Defect Sizing Using Non-destructive Ultrasonic Testing

Defect Sizing Using Non-destructive Ultrasonic Testing: Applying Bandwidth-Dependent DAC and DGS Curves

Sale price  $107.99 Regular price  $119.99

Reliable shipping

Flexible returns

Defect Sizing Using Non-destructive Ultrasonic Testing: Applying Bandwidth-Dependent DAC and DGS Curves

Kleinert, Wolf

This book presents a precise approach for defect sizing using ultrasonics. It describes an alternative to the current European and American standards by neglecting their limitations. The approach presented here is not only valid for conventional angle beam probes, but also for phased array angle beam probes. It introduces an improved method which provides a significant productivity gain and calculates curves with high accuracy. Its content is of interest to all those working with distance gain size (DGS) methods or are using distance amplitude correction (DAC) curves.

Details

Published by: Springer

Publication Date: 2016-05-13

Format: Hardcover

ISBN-13: 9783319328348

DOI: 10.1007/978-3-319-32836-2

Dimensions: 235cm x155cm

Pages: 118

You may also like