Springer Series in Optical Sciences: Volume 1: Fundamental Principles and Solar Cell Characterization

Fujiwara, Hiroyuki; Collins, Robert W.

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.

The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

Details

Published by: Springer

Publication Date: 2019-01-24

Format: Hardcover

ISBN-13: 9783319753751

DOI: 10.1007/978-3-319-75377-5

Dimensions: 235cm x155cm

Pages: 594