Springer Series in Surface Sciences

Toporski, Jan; Dieing, Thomas; Hollricher, Olaf

This second edition provides a cutting-edge overview of physical, technical and scientific aspects related to the widely used analytical method of confocal Raman microscopy. The book includes expanded background information and adds insights into how confocal Raman microscopy, especially 3D Raman imaging, can be integrated with other methods to produce a variety of correlative microscopy combinations. The benefits are then demonstrated and supported by numerous examples from the fields of materials science, 2D materials, the life sciences, pharmaceutical research and development, as well as the geosciences.

Details

Published by: Springer

Publication Date: 2018-03-16

Format: Hardcover

ISBN-13: 9783319753782

DOI: 10.1007/978-3-319-75380-5

Dimensions: 235cm x155cm

Pages: 596