{"product_id":"9783319820545","title":"Knowledge-Driven Board-Level Functional Fault Diagnosis","description":"\u003ch1\u003eKnowledge-Driven Board-Level Functional Fault Diagnosis\u003c\/h1\u003e \u003ch2\u003eYe, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli\u003c\/h2\u003e \u003cp\u003e\u003c\/p\u003e\u003cdiv\u003eThis book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.\u003c\/div\u003e\u003cdiv\u003e\u003cbr\u003e\u003c\/div\u003e\u003cdiv\u003e•\tExplains and applies optimized techniques from the machine-learning      \tdomain to solve the fault diagnosis problem in the realm of electronic \tsystem design and manufacturing;\u003c\/div\u003e\u003cdiv\u003e•\tDemonstrates techniques based on industrial data and feedback from an \tactual manufacturing line;\u003c\/div\u003e\u003cdiv\u003e•\tDiscusses practical problems, including diagnosis accuracy, diagnosis \ttime cost, evaluation of diagnosis system, handling of missing syndromes \tin diagnosis, and need for fast diagnosis-system development.\u003c\/div\u003e\u003cdiv\u003e\u003cbr\u003e\u003c\/div\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 2018-06-14\u003c\/p\u003e \u003cp\u003eFormat: Paperback\u003c\/p\u003e \u003cp\u003eISBN-13: 9783319820545\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/978-3-319-40210-9\u003c\/p\u003e \u003cp\u003eDimensions: 235cm x155cm\u003c\/p\u003e \u003cp\u003ePages: 147\u003c\/p\u003e ","brand":"Springer International Publishing","offers":[{"title":"Default Title","offer_id":47525314134156,"sku":"9783319820545","price":89.1,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9783319820545.jpg?v=1776021708","url":"https:\/\/lateknightbooks.com\/products\/9783319820545","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}