Springer Series in Advanced Microelectronics: Basics and Use for Evaluating Electronic Devices and Materials

Breitenstein, Otwin; Warta, Wilhelm; Schubert, Martin C.

This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.

Details

Published by: Springer

Publication Date: 2019-01-22

Format: Hardcover

ISBN-13: 9783319998244

DOI: 10.1007/978-3-319-99825-1

Dimensions: 235cm x155cm

Pages: 321