Defect Complexes in Semiconductor Structures: Proceedings of the International School Held in Mátrafüred, Hungary, September 13 – 17, 1982

Giber, J.; Beleznay, F.; Szep, I. C.; Laszlo, J.

Details

Published by: Springer

Publication Date: 1983-02-01

Format: Paperback

ISBN-13: 9783540119869

DOI: 10.1007/3-540-11986-8

Dimensions: 244.0cm x170.0cm

Pages: 311.0