Integrated Uncertainty Management and Applications

Huynh, Van-Nam; Nakamori, Yoshiteru; Lawry, Jonathan; Inuiguchi, Masahiro

Solving practical problems often requires the integration of information and knowledge from many different sources, taking into account uncertainty and impreciseness. The 2010 International Symposium on Integrated Uncertainty Management and Applications (IUM’2010), which takes place at the Japan Advanced Institute of Science and Technology (JAIST), Ishikawa, Japan, between 9th–11th April, is therefore conceived as a forum for the discussion and exchange of research results, ideas for and experience of application among researchers and practitioners involved with all aspects of uncertainty modelling and management.

Details

Published by: Springer

Publication Date: 2010-03-05

Format: Paperback

ISBN-13: 9783642119590

DOI: 10.1007/978-3-642-11960-6

Dimensions: 235.0cm x155.0cm

Pages: 560.0