Springer Tracts in Advanced Robotics: Modelling, Simulation, Setup Building and Experiments
Reliable shipping
Flexible returns
Springer Tracts in Advanced Robotics: Modelling, Simulation, Setup Building and Experiments
Xie, Hui; Onal, Cagdas; Régnier, Stéphane; Sitti, Metin
The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.
There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education.
Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.
Details
Published by: Springer
Publication Date: 2014-11-26
Format: Paperback
ISBN-13: 9783642445019
DOI: 10.1007/978-3-642-20329-9
Dimensions: 235cm x155cm
Pages: 344