Skip to product information
X-Ray Diffraction by Disordered Lamellar Structures

X-Ray Diffraction by Disordered Lamellar Structures: Theory and Applications to Microdivided Silicates and Carbons

Sale price  $98.99 Regular price  $109.99

Reliable shipping

Flexible returns

X-Ray Diffraction by Disordered Lamellar Structures: Theory and Applications to Microdivided Silicates and Carbons

Besson, Gerard; Drits, Victor A.; Guinier, Andre; Setton, R.; Bookin, Alexander S.; Tchoubar, Cyril; Rousseaux, Francoise; Sakharov, Boris A.; Tchoubar, Denise

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.

Details

Published by: Springer

Publication Date: 2011-12-13

Format: Paperback

ISBN-13: 9783642748042

DOI: 10.1007/978-3-642-74802-8

Dimensions: 235.0cm x155.0cm

Pages: 371.0

You may also like