Springer Series in Solid-State Sciences

In-Hang, Shih-Lin

The three-dimensional arrangement of atoms and molecules in crystals and the comparable magnitude of x-ray wavelengths and interatomic distances make it possible for crystals to have more than one set of atomic planes that satisfy Bragg's law and simultaneously diffract an incident x-ray beam - this is the so-called multiple diffraction. This type of diffraction should, in prin­ ciple, reflect three-dimensional information about the structure of the dif­ fracting material. Recent progress in understanding this diffraction phenome­ non and in utilizing this diffraction technique in solid-state and materials sciences reveals the diversity as well as the importance of multiple diffraction of x-rays in application. Unfortunately, there has been no single book written that gives a sys­ tematic review of this type of diffraction, encompasses its diverse applica­ tions, and foresees future trends gf development. It is for this purpose that this book is designed. It is hoped that its appearance may possibly turn more attention of condensed-matter physicists, chemists and material scientists toward this particular phenomenon, and that new methods of non-destructive analysis of matter using this diffraction technique may be developed in the future.

Details

Published by: Springer

Publication Date: 2011-12-22

Format: Paperback

ISBN-13: 9783642821684

DOI: 10.1007/978-3-642-82166-0

Dimensions: 235cm x155cm

Pages: 300