Springer Series in Surface Sciences

Hinrichs, Karsten; Eichhorn, Klaus-Jochen

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

Details

Published by: Springer

Publication Date: 2016-08-23

Format: Paperback

ISBN-13: 9783662510209

DOI: 10.1007/978-3-642-40128-2

Dimensions: 235cm x155cm

Pages: 363