Springer Series in Materials Science: Basic and Advanced Applications

Baranov, Pavel G.; von Bardeleben, Hans Jürgen; Jelezko, Fedor; Wrachtrup, Jörg

This book explains different magnetic resonance (MR) techniques and uses different combinations of these techniques to analyze defects in semiconductors and nanostructures. It also introduces novelties such as single defects MR and electron-paramagnetic-resonance-based methods: electron spin echo, electrically detected magnetic resonance, optically detected magnetic resonance and electron-nuclear double resonance – the designated tools for investigating the structural and spin properties of condensed systems, living matter, nanostructures and nanobiotechnology objects. Further, the authors address problems existing in semiconductor and nanotechnology sciences that can be resolved using MR, and discuss past, current and future applications of MR, with a focus on advances in MR methods.

The book is intended for researchers in MR studies of semiconductors and nanostructures wanting a comprehensive review of what has been done in their own and related fields of study, as well asfuture perspectives.

Details

Published by: Springer

Publication Date: 2017-03-27

Format: Hardcover

ISBN-13: 9783709111567

DOI: 10.1007/978-3-7091-1157-4

Dimensions: 235cm x155cm

Pages: 524