{"product_id":"9789400777804","title":"Springer Series in Advanced Microelectronics: Circuits and Algorithms","description":"\u003ch1\u003eSpringer Series in Advanced Microelectronics: Circuits and Algorithms\u003c\/h1\u003e \u003ch2\u003eZjajo, Amir\u003c\/h2\u003e \u003cp\u003e\u003c\/p\u003e\u003cp\u003eOne of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a \u003ci\u003estochastic\u003c\/i\u003e process. In addition to \u003ci\u003ewide-sense stationary stochastic\u003c\/i\u003e device variability and temperature variation, existence of \u003ci\u003enon-stationary stochastic\u003c\/i\u003e electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits.\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e\u003cp\u003eIn an attempt to address these issues, \u003ci\u003eStochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms\u003c\/i\u003e offers unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring and performance calibration. The associated problems are addressed at various abstraction levels, i.e. circuit level, architecture level and system level. It therefore provides a broad view on the various solutions that have to be used and their possible combination in very effective complementary techniques for both analog\/mixed-signal and digital circuits. The feasibility of the described algorithms and built-in circuitry has been verified by measurements from the silicon prototypes fabricated in standard 90 nm and 65 nm CMOS technology. \u003c\/p\u003e\u003cp\u003e\u003cb\u003e \u003c\/b\u003e\u003c\/p\u003e \u003ch3\u003eDetails\u003c\/h3\u003e \u003cp\u003ePublished by: Springer\u003c\/p\u003e \u003cp\u003ePublication Date: 2013-11-28\u003c\/p\u003e \u003cp\u003eFormat: Hardcover\u003c\/p\u003e \u003cp\u003eISBN-13: 9789400777804\u003c\/p\u003e \u003cp\u003eDOI: 10.1007\/978-94-007-7781-1\u003c\/p\u003e \u003cp\u003eDimensions: 235cm x155cm\u003c\/p\u003e \u003cp\u003ePages: 192\u003c\/p\u003e ","brand":"Springer Netherlands","offers":[{"title":"Default Title","offer_id":47662103265420,"sku":"9789400777804","price":116.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0710\/9545\/1788\/files\/9789400777804.jpg?v=1776437842","url":"https:\/\/lateknightbooks.com\/products\/9789400777804","provider":"Late Knight Books and Services, LLC","version":"1.0","type":"link"}