SpringerBriefs in Applied Sciences and Technology: New Perspectives for Materials Characterization

Brodusch, Nicolas; Demers, Hendrix; Gauvin, Raynald

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Details

Published by: Springer

Publication Date: 2017-10-06

Format: Paperback

ISBN-13: 9789811044328

DOI: 10.1007/978-981-10-4433-5

Dimensions: 235cm x155cm

Pages: 137