Understand the principles and applications of surface analysis

Analyzing the composition of a given surface is a crucial aspect of materials science, with significant bearing on the way a material will interact with a particular environment. Surface analysis draws upon a substantial body of research to analyze the outer few nanometres of a material, and has considerable significance in laboratories studying corrosion, adhesion, polymer surface treatment and more.

Surface Analysis offers a comprehensive and accessible overview of the characterization and analysis of outer substrate layers. It brings together experts in each analysis area to lay out foundational theory, offer practical applications, and provide examples. Now fully up to date and reflecting the latest research, it is a must-own for any scientist incorporating surface analysis into laboratory work.

Readers of the third edition of Surface Analysis readers will also find:

• Two new chapters on advanced mass spectrometry methods
• Detailed coverage of ever-more-important methods of data analysis
• Tools for concretely improving laboratory and research outcomes

Surface Analysis is ideal for practitioners and advanced graduate students in materials science, solid state physics, optics, and chemistry.

John C. Vickerman, PhD, DSc, is Professor Emeritus at the University of Manchester in the Surface Analysis Research Centre. He got his PhD in Surface Chemistry at the University of Bristol and held postdoctoral fellowships at the University of Bristol and the Technical University of Eindhoven. He is known as a pioneer and international leader in the development of surface analysis by secondary ion mass spectrometry (SIMS).

Ian Gilmore, PhD, is a Principal Research Scientist in the Surface and Nano-Analysis Research team at the National Physical Laboratory in Teddington, UK. He received his PhD from the University of Loughborough in 2000. His research has a focus on the analysis of complex molecules at surfaces. Recent research has led to the development of a novel new variant of static SIMS called gentle- SIMS or G-SIMS. Ian is a Fellow of the Institute of Physics, a member of the EPSRC College and a member of the American Vacuum Society.