Advances in X-Ray Analysis: Volume 35B

Barrett, C.S.; Gilfrich, John V.; Huang, Ting C.; Jenkins, Ron; McCarthy, G.J.; Predecki, Paul K.; Ryon, R.; Smith, Deane K.

Details

Published by: Springer

Publication Date: 2012-11-21

Format: Paperback

ISBN-13: 9781461365327

DOI: 10.1007/978-1-4615-3460-0

Dimensions: 244cm x170cm

Pages: 641