Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, Proceedings

Torsello, Andrea; Rossi, Luca; Pelillo, Marcello; Biggio, Battista; Robles-Kelly, Antonio

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021.

The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions.

The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

Details

Published by: Springer

Publication Date: 2021-04-10

Format: Paperback

ISBN-13: 9783030739720

DOI: 10.1007/978-3-030-73973-7

Dimensions: 235.0cm x155.0cm

Pages: 378.0