Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26–27, 2022, Proceedings

Krzyzak, Adam; Suen, Ching Y.; Torsello, Andrea; Nobile, Nicola

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2022, held in Montreal, QC, Canada, in August 2022.

The 30 papers together with 2 invited talks presented in this volume were carefully reviewed and selected from 50 submissions. The workshops presents papers on topics such as deep learning, processing, computer vision, machine learning and pattern recognition and much more.

Details

Published by: Springer

Publication Date: 2023-01-02

Format: Paperback

ISBN-13: 9783031230271

DOI: 10.1007/978-3-031-23028-8

Dimensions: 235.0cm x155.0cm

Pages: 324.0