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VLSI Design and Test

VLSI Design and Test 29th International Symposium, VDAT 2025, Chandigarh, India, August 7–9, 2025, Proceedings, Part I

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Communications in Computer and Information Science

VLSI Design and Test

29th International Symposium, VDAT 2025, Chandigarh, India, August 7–9, 2025, Proceedings, Part I

Brajesh Rawat | Hitesh Shirmali | Shivani Malhotra | Rohit Y. Sharma | Neeraj Goel

Computers / Hardware / General

This two-volume set CCIS 2983-2984 constitutes the referred proceedings of the 29th International Symposium on VLSI Design and Test, VDAT 2025, held in Chandigarh, India, during August 7–9, 2025.

The 105 full papers included in these volumes were carefully reviewed and selected from 415 submissions. They are organized into thematic sections as follows: Emerging Devices and Technology; Analog and Mixed Signal Design; Digital Design and Systems; Memory and Computing Architectures; RF and Embedded Systems; AI Accelerators and Advanced Architectures. 


Publication Date: 26 July 2026
Publisher: Springer Nature Switzerland
Imprint: Springer
ISBN-13: 9783032263049
Format: Paperback / softback
Page Count: 562

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