What does it take to see a single atom — or to pick one up and move it? This book takes the reader to the frontier of the very small: atomic force microscopy at its ultimate resolution, force spectroscopy on individual bonds, and the use of the probe tip to manipulate matter atom by atom. It develops both the experimental technique and the underlying theory, examining the origins of interatomic forces and the challenge of measuring them against ubiquitous noise — and the strategies that push the signal-to-noise ratio to its limits.

Many key historical experiments and the pioneers behind them are described, revealing how the founding fathers of nanoscience ventured into territory no one had entered before.

Franz J. Giessibl was born in 1962. He has been gathering laboratory experience in laser optics since 1978, obtaining a Diploma at TU Munich in semiconductor physics in 1987. From 1988-1991 he undertook PhD studies with Nobel laureate Gerd Binnig on atomic force microscopy (AFM), and in 1992 was a postdoc with Binnig's group at IBM. From 1992-1994 he worked for a silicon valley startup company that builds AFMs and was involved in achieving the first atomic-resolution AFM results for silicon, which launched the field of noncontact AFM. Giessibl became a strategic management consultant with McKinsey from 1995-1996, during which time he invented and patented the qPlus sensor in his spare time. From 1997-2005 he undertook the habilitation at U. Augsburg, subsequently being offered chairs at Bristol and Regensburg. In 2006 he became professor in Regensburg. Franz J. Giessibl's previous works include: Contributed chapters to Springer books Nanotechnology (Bushan), Noncontact AFM Vol I (2002), Coedited books Noncontact AFM Vol II (2009) and Vol III (2015) with Morita, Meyer, Wiesendanger. He has also published the book "First View inside an Atom - Encounters with Gerhard Richter between Art and Science" Walther König Verlag Cologne (2022).