Combinatorial Pattern Matching: 16th Annual Symposium, CPM 2005, Jeju Island, Korea, June 19-22, 2005, Proceedings

Apostolico, Alberto; Crochemore, Maxime; Park, Kunsoo

Details

Published by: Springer

Publication Date: 2005-06-02

Format: Paperback

ISBN-13: 9783540262015

DOI: 10.1007/b137128

Dimensions: 234.0cm x156.0cm

Pages: 452.0