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Springer Series in Chemical Physics
  • Springer Series in Chemical Physics
Springer Series in Chemical Physics: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979

Springer Series in Chemical Physics: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979

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Springer Series in Chemical Physics: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979

Benninghoven, A.; Evans, C.A. Jr.; Powell, R.A.; Shimizu, R.; Storms, H.A.

Details

Published by: Springer

Publication Date: 2011-12-13

Format: Paperback

ISBN-13: 9783642618734

DOI: 10.1007/978-3-642-61871-0

Dimensions: 229cm x152cm

Pages: 300

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