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Electron Impact Ion Sources for Charged Heavy Ions

Electron Impact Ion Sources for Charged Heavy Ions

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Electron Impact Ion Sources for Charged Heavy Ions

Grigory D. Shirkov | Günter Zschornack

Technology & Engineering / General

Presently many different types of ion sources exist worldwide for producing highly charged ions. The object of the present book is the treatment of electron impact ion sources like ECR (Electron Qyclotron .Resonance) ion sources, EBIS (Electron .B_eam Ion S.ources), EBIT Electron .B_eam Ion Irap) and ERIS (Electron .Ring Ion S.ources), which altogether are able to produce ions of high charge states. This criterion delimits the book according to classic ion sources, which as a rule can deliver high currents of low charged ions. In the last decades there has been an intense development and building-up of sources of highly charged ions. The first impetus to the building of such sources came from heavy ion accelerator centers, since the effectiveness of a heavy ion accelerator is predominantly determined by the available ion sources. Thereby, the critical criterions for the operation of an ion source are the charge state distribution of the ions produced and the intensity of the extracted ion currents. Besides the employment of sources of highly charged ions in accelerator centers such sources increasingly are inserted separately from accelerators for basic investigations in atomic physics, surface physics and related areas.
Dr. sc Grigory Shirkov works as a scientist at the Joint Institute for Nuclear Research in Dubna near to Moscow, Russia.
PD Dr. habil. Günter Zschornack is member of the Institute of Nuclear and Participle Physics and leader of the atomic physics group at the Technical University of Dresden, Germany.


Dr. sc. Grigory Shirkov arbeitet am Joint Institute for Nuclear Research in Dubna bei Moskau.
PD Dr. habil. Günter Zschornack arbeitet am Institut für Kern- und Teilchenphysik als Leiter der Arbeitsgruppe Atomphysik der Technischen Universität Dresden.

Publication Date: 13 November 2013
Publisher: Vieweg+Teubner Verlag
Imprint: Vieweg+Teubner Verlag
ISBN-13: 9783663098980
Format: Paperback softback
Page Count: 320

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